Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
2nd Revised edition
By (author) S. J. B. Reed
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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology by S. J. B. Reed
Book DescriptionOriginally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
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Book DetailsISBN: 9780521848756
(247mm x 174mm x 14mm)
Imprint: Cambridge University Press
Publisher: Cambridge University Press
Publish Date: 25-Aug-2005
Country of Publication: United Kingdom
Books By Author S. J. B. Reed
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology, Paperback (June 2010)
This 2005 book covers principles and techniques of EMPA and SEM for geological graduate students and postdoctoral workers.
Electron Microprobe Analysis, Paperback (July 1997)» View all books by S. J. B. Reed
1993 paperback of successful physics monograph on electron microprobe analysis, a widely used technique.
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