Electronic Design Automation by Laung-Terng Wang
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Electronic Design Automation
By Laung-Terng Wang

Electronic Design Automation

Synthesis, Verification, and Test

Edited by See other recent books by Laung-Terng Wang See other recent books by Kwang-Ting Cheng See other recent books by Yao-Wen Chang
Format: Hardback

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Electronic Design Automation by Laung-Terng Wang

Book Description

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an 'adjacent' field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. This title covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - which helps EDA newcomers to get 'up-and-running' quickly. It includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - which helps all readers improve their VLSI design competence. It contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - which helps readers to design/develop testable chips or products. It also includes industry best-practices wherever appropriate in most chapters - which helps readers avoid costly mistakes.

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Book Details

ISBN: 9780123743640
ISBN-10: 0123743648
Format: Hardback
(235mm x 191mm x 47mm)
Pages: 972
Imprint: Morgan Kaufmann Publishers In
Publisher: Elsevier Science & Technology
Publish Date: 26-Mar-2009
Country of Publication: United States

Books By Author Laung-Terng Wang

System-on-Chip Test Architectures by Laung-Terng Wang System-on-Chip Test Architectures, Hardback (January 2008)

A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students.

VLSI Test Principles and Architectures by Laung-Terng Wang VLSI Test Principles and Architectures, Hardback (August 2006)

A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. It provides coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools.

» View all books by Laung-Terng Wang

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Author Biography - Laung-Terng Wang

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007). Yao-Wen Chang, Ph.D., is a Professor in the Department of Electrical Engineering, National Taiwan University. He recevied his Ph.D. degree in Computer Science from the University of Texas at Austin. He has published over 200 technical papers, co-authored one book, and is a winner of the ACM ISPD Placement (2006) and Global Routing (2008) contests. Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.

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