Electronic Design Automation
Synthesis, Verification, and Test
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Electronic Design Automation by Laung-Terng Wang
Book DescriptionThis book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an 'adjacent' field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. This title covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - which helps EDA newcomers to get 'up-and-running' quickly. It includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - which helps all readers improve their VLSI design competence. It contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - which helps readers to design/develop testable chips or products. It also includes industry best-practices wherever appropriate in most chapters - which helps readers avoid costly mistakes.
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Book DetailsISBN: 9780123743640
(235mm x 191mm x 47mm)
Imprint: Morgan Kaufmann Publishers In
Publisher: Elsevier Science & Technology
Publish Date: 26-Mar-2009
Country of Publication: United States
Books By Author Laung-Terng Wang
System-on-Chip Test Architectures, Hardback (January 2008)
A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students.
VLSI Test Principles and Architectures, Hardback (August 2006)» View all books by Laung-Terng Wang
A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. It provides coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools.
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Author Biography - Laung-Terng Wang
Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007). Yao-Wen Chang, Ph.D., is a Professor in the Department of Electrical Engineering, National Taiwan University. He recevied his Ph.D. degree in Computer Science from the University of Texas at Austin. He has published over 200 technical papers, co-authored one book, and is a winner of the ACM ISPD Placement (2006) and Global Routing (2008) contests. Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.
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