Modeling and Characterization of RF and Microwave Power FETs
Characterization and Modeling of LDMOS and III-V Devices
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Modeling and Characterization of RF and Microwave Power FETs by Peter Aaen
Book DescriptionThis book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.
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Book DetailsISBN: 9780521870665
(247mm x 174mm x 22mm)
Imprint: Cambridge University Press
Publisher: Cambridge University Press
Publish Date: 25-Jun-2007
Country of Publication: United Kingdom
Books By Author Peter Aaen
Modeling and Characterization of RF and Microwave Power FETs, Paperback (June 2011)» View all books by Peter Aaen
This book was the first to be devoted to the compact modeling of RF power FETs.
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Author Biography - Peter Aaen
Peter H. Aaen is the Modeling Group Manager in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. Jaime A. Pia is the Design Organization Manager in the RF Division at Freescale in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. John Wood is Senior Technical Contributor responsible for RF CAD and Modeling in the RF Division at Freescale Semiconductor, Inc., Tempe, Arizona. He is a Fellow of the IEEE.
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