RFID Technology and Applications by Stephen B. Miles
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RFID Technology and Applications
By Stephen B. Miles

RFID Technology and Applications


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RFID Technology and Applications by Stephen B. Miles

Book Description

Are you an engineer or manager working on the development and implementation of RFID technology? If so, this book is for you. Covering both passive and active RFID systems, the challenges to RFID implementation are addressed using specific industry research examples and common integration issues. Key topics include RF tag performance optimization, evaluation methodologies for RFID and Real-Time-Location Systems (RTLS) and sensors, EPC network simulation, RFID in the retail supply chain, and applications in product lifecycle management, anti-counterfeiting and cold chain management. The book brings together insights from the world's leading research laboratories in the field, including the Auto-ID Labs at MIT, successor to the Auto-ID Center which developed the Electronic Product Code scheme which is set to become the global standard for product identification.MIT Auto-ID Labs's suite of Open Source code and tools for RFID implementation is available at www.cambridge.org/9780521880930.

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Book Details

ISBN: 9780521880930
ISBN-10: 0521880939
Format: Hardback
(247mm x 174mm x 14mm)
Pages: 244
Imprint: Cambridge University Press
Publisher: Cambridge University Press
Publish Date: 29-May-2008
Country of Publication: United Kingdom

Other Editions...


Books By Author Stephen B. Miles

RFID Technology and Applications by Stephen B. Miles RFID Technology and Applications, Paperback (April 2011)

This book addresses the challenges, trends and key business questions in RFID development and implementation.

» View all books by Stephen B. Miles

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Author Biography - Stephen B. Miles

Stephen B. Miles is a research engineer for the Auto-ID Lab. at MIT. He has over 15 years of experience in computer network integration and services. Sanjay E. Sarma is currently an associate professor at MIT, where he is also a co-founder of the Auto-ID Center. He serves on the board of EPC global, the world wide standards body he helped to start up. John R. Williams is Director of the Auto-ID Lab at MIT, and is also a professor of Information Engineering in Civil and Environmental Engineering. As well as many years of lecturing, he has also worked in industry and was the Vice President of Engineering at two software start-up companies.

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