Surface Analysis of Polymers by XPS and Static SIMS
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Surface Analysis of Polymers by XPS and Static SIMS by D. Briggs
Book DescriptionThis book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
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Book DetailsISBN: 9780521017534
(247mm x 174mm x 12mm)
Imprint: Cambridge University Press
Publisher: Cambridge University Press
Publish Date: 15-Dec-2005
Country of Publication: United Kingdom
Books By Author D. Briggs
Decision-making in Environmental Health, Paperback (April 2000)
This book examines the need for information in support of decision-making in environmental health. An invaluable source of information for researchers in public health, epidemiology and social science.
Surface Analysis of Polymers by XPS and Static SIMS, Hardback (April 1998)» View all books by D. Briggs
The book describes the development of two powerful techniques for polymer surface studies.
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