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Description - Applied Measurement with jMetrik by J. Patrick Meyer

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

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Book Details

ISBN: 9780415531955
ISBN-10: 0415531950
Format: Hardback
(229mm x 152mm x mm)
Pages: 149
Imprint: Routledge
Publisher: Taylor & Francis Ltd
Publish Date: 30-Jun-2014
Country of Publication: United Kingdom

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Author Biography - J. Patrick Meyer

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia