Call Boomerang Books 1300 36 33 32

Get Latest Book News + FREE Shipping. Subscribe to the Boomerang Books Bulletin eNewsletter right now!

Description - Atomic Force Microscopy by Peter Eaton

Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

Buy Atomic Force Microscopy by Peter Eaton from Australia's Online Independent Bookstore, Boomerang Books.

Book Details

ISBN: 9780199570454
ISBN-10: 0199570450
Format: Hardback
(256mm x 174mm x 17mm)
Pages: 256
Imprint: Oxford University Press
Publisher: Oxford University Press
Publish Date: 25-Mar-2010
Country of Publication: United Kingdom

Book Reviews - Atomic Force Microscopy by Peter Eaton

» Have you read this book? We'd like to know what you think about it - write a review about Atomic Force Microscopy book by Peter Eaton and you'll earn 50c in Boomerang Bucks loyalty dollars (you must be a Boomerang Books Account Holder - it's free to sign up and there are great benefits!)

Write Review


Author Biography - Peter Eaton

Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM. Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.