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Description - Transmission Lines and Lumped Circuits by Giovanni Miano

The theory of transmission lines is a classical topic of electrical engineering. Recently this topic has received renewed attention and has been a focus of considerable research. This is because the transmisson line theory has found new and important applications in the area of high-speed VLSI interconnects, while it has retained its significance in the area of power transmission. In many applications, transmission lines are connected to nonlinear circuits. For instance, interconnects of high-speed VLSI chips can be modelled as transmission lines loaded with nonlinear elements. These nonlinearities may lead to many new effects such as instability, chaos, generation of higher order harmonics, etc. The mathematical models of transmission lines with nonlinear loads consist of the linear partial differential equations describing the current and voltage dynamics along the lines together with the nonlinear boundary conditions imposed by the nonlinear loads connected to the lines. These nonlinear boundary conditions make the mathematical treatment very difficult. For this reason, the analysis of transmission lines with nonlinear loads has not been addressed adequately in the existing literature. The unique and distinct feature of the proposed book is that it will present systematic, comprehensive, and in-depth analysis of transmission lines with nonlinear loads.

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Book Details

ISBN: 9780121897109
ISBN-10: 0121897109
Format: Hardback
(229mm x 152mm x 31mm)
Pages: 479
Imprint: Academic Press Inc
Publisher: Elsevier Science Publishing Co Inc
Publish Date: 23-Feb-2001
Country of Publication: United States

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Author Biography - Giovanni Miano

Antonio Maffucci is Associate Professor of Electrical Engineering at the University of Cassino and Southern Lazio. Since 2014, he has also been associated to the INFN, Frascati National Laboratories. His research focuses on issues of electromagnetic and circuit modeling, computational electromagnetics, electromagnetic compatibility, nanotechnology. He is the author of 160 international publications, 3 reviews, 1 book, 7 book chapters and 4 receiverships.