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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Buy VLSI Test Principles and Architectures book by Laung-Terng Wang from Australia's Online Bookstore, Boomerang Books.

Book Details

ISBN: 9780123705976
ISBN-10: 0123705975
Format: Hardback
(235mm x 190mm x 52mm)
Pages: 808
Imprint: Morgan Kaufmann Publishers In
Publisher: Elsevier Science & Technology
Publish Date: 14-Aug-2006
Country of Publication: United States

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Author Biography - Laung-Terng Wang

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

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