Call Boomerang Books 1300 36 33 32

Description - System-on-Chip Test Architectures by Laung-Terng Wang

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.

Buy System-on-Chip Test Architectures by Laung-Terng Wang from Australia's Online Independent Bookstore, Boomerang Books.

Book Details

ISBN: 9780123739735
ISBN-10: 012373973X
Format: Hardback
(235mm x 191mm x mm)
Pages: 896
Imprint: Morgan Kaufmann Publishers In
Publisher: Elsevier Science & Technology
Publish Date: 1-Nov-2007
Country of Publication: United States

Book Reviews - System-on-Chip Test Architectures by Laung-Terng Wang

» Have you read this book? We'd like to know what you think about it - write a review about System-on-Chip Test Architectures book by Laung-Terng Wang and you'll earn 50c in Boomerang Bucks loyalty dollars (you must be a Boomerang Books Account Holder - it's free to sign up and there are great benefits!)

Write Review

Author Biography - Laung-Terng Wang

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Books By Laung-Terng Wang

Electronic Design Automation by Laung-Terng Wang
Hardback, February 2009
VLSI Test Principles and Architectures by Laung-Terng Wang
Hardback, June 2006