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Description - Scanning Electron Microscopy and X-ray Microanalysis by Joseph I. Goldstein

This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A data base of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.

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Book Details

ISBN: 9780306472923
ISBN-10: 0306472929
Format: Hardback
(230mm x 188mm x 50mm)
Pages: 586
Imprint: Kluwer Academic / Plenum Publishers
Publisher: Kluwer Academic Publishers Group
Publish Date: 1-Sep-2002
Country of Publication: Netherlands

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Author Biography - Joseph I. Goldstein

This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.