1300 36 33 32

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Buy Electron Microprobe Analysis and Scanning Electron Microscopy in Geology book by S. J. B. Reed from Australia's Online Bookstore, Boomerang Books.

Book Details

ISBN: 9780521848756
ISBN-10: 052184875X
Format: Hardback
(247mm x 174mm x 14mm)
Pages: 232
Imprint: Cambridge University Press
Publisher: Cambridge University Press
Publish Date: 25-Aug-2005
Country of Publication: United Kingdom

Reviews

» Have you read this book? We'd like to know what you think about it - write a review about Electron Microprobe Analysis and Scanning Electron Microscopy in Geology book by S. J. B. Reed and you'll earn 50c in Boomerang Bucks loyalty dollars (you must be a member - it's free to sign up!)

Write Review


Books By Author S. J. B. Reed

Electron Microprobe Analysis by S. J. B. Reed

Electron Microprobe Analysis

Paperback, July 1997
$76.46