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Description - Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997 by John M. Rodenburg

This volume explores the development and applications of electron microscopy from its first introduction. As with previous meetings in the series, recent advances in electron microscopy and related analytical techniques practised on electron microscopes are discussed. Particular emphasis is given to the development of new instrumentation, analysis of the information content of images and spectra and applications to the study of materials. Progress in complementary techniques such as scanning probe microscopies and image processing is also examined.

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Book Details

ISBN: 9780750304412
ISBN-10: 0750304413
Format: Hardback
(279mm x 216mm x 38mm)
Pages: 708
Imprint: Institute of Physics Publishing
Publisher: Taylor & Francis Ltd
Publish Date: 1-Jan-1997
Country of Publication: United Kingdom

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