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Description - Defect Recognition and Image Processing in Semiconductors 1997 by J. Donecker

This volume addresses: advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers and devices; the merits and limits of characterization techniques; standardization; correleations between defects and device formation performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques now available. It investigates defects in layers and devices, and examines the problems which have arisen in characterizing gallium nitride and silicon carbide.

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Book Details

ISBN: 9780750305006
ISBN-10: 0750305002
Format: Hardback
(235mm x 156mm x 30mm)
Pages: 524
Imprint: Institute of Physics Publishing
Publisher: Taylor & Francis Ltd
Publish Date: 1-Jan-1998
Country of Publication: United Kingdom

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