Description - Microscopy of Semiconducting Materials by A. G. Cullis
This collection of papers provide an international forum for research professionals to discuss and disseminate their results. It focuses on the developments in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. Advances in the use of other microcharactisation techniques including scanning probe microscopy and X-ray topography and diffraction are also featured. The materials of interest cover the complete range of elemental and compound semiconductors.
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(235mm x 156mm x 41mm)
Institute of Physics Publishing
Publisher: Taylor & Francis Ltd
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