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Description - Microscopy of Semiconducting Materials by A. G. Cullis

This collection of papers provide an international forum for research professionals to discuss and disseminate their results. It focuses on the developments in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. Advances in the use of other microcharactisation techniques including scanning probe microscopy and X-ray topography and diffraction are also featured. The materials of interest cover the complete range of elemental and compound semiconductors.

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Book Details

ISBN: 9780750306508
ISBN-10: 0750306505
Format: Hardback
(235mm x 156mm x 41mm)
Pages: 774
Imprint: Institute of Physics Publishing
Publisher: Taylor & Francis Ltd
Publish Date: 1-Jan-2000
Country of Publication: United Kingdom

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