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Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.

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Book Details

ISBN: 9780750309677
ISBN-10: 0750309679
Format: Hardback
(235mm x 156mm x 31mm)
Pages: 279
Imprint: Institute of Physics Publishing
Publisher: Taylor & Francis Ltd
Publish Date: 19-Feb-2004
Country of Publication: United Kingdom

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