International Tables for Crystallography is the definitive resource and reference work for crystallography and structural science. Each of the eight volumes in the series contains articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials. Emphasis is given to symmetry, diffraction methods and techniques of crystal-structure determination, and the physical and chemical properties of crystals. The data are accompanied by discussions of theory, practical explanations and examples, all of which are useful for teaching. Volume B provides the reader with competent and useful accounts of the numerous aspects of reciprocal space in crystallographic research. Following an introductory chapter, the volume is divided into five parts: Part 1: Presents an account of structure factor formalisms, extensive treatment of the theory, algorithms and crystallographic applications of Fourier methods, and fundamental as well as advanced treatments of symmetry in reciprocal space.
Part 2: Discusses crystallographic statistics, the theory of direct methods, Patterson techniques, isomorphous replacement and anomalous scattering, and treatments of the role of electron microscopy and diffraction in crystal- structure determination. Part 3: Includes applications of reciprocal space to molecular geometry and 'best'-plane calculations, and contains a treatment of the principles of molecular graphics and modeling and their applications. Part 4: Contains treatments of various diffuse-scattering phenomena arising from crystal dynamics, disorder and low dimensionality (liquid crystals), and an exposition of the underlying theories and/or experimental evidence. Polymer crystallography and reciprocal-space images of aperiodic crystals are also treated. Part 5: Discusses introductory treatments of the theory of the interaction of radiation with matter (dynamical theory) as applied to X-ray, electron and neutron diffraction techniques.
Substantially revised and updated to take into account recent developments, the third edition of volume B includes contributions from seven new authors and a new chapter on extensions of the Ewald method for Coulomb interactions in crystals. There are three new sections on electron diffraction and electron microscopy in structure determination. Volume B is a vital addition to the library of scientists engaged in crystal-structure determination, crystallographic computing, crystal physics and other fields of crystallographic research. Graduate students specializing in crystallography will find much material suitable for self-study and a rich source of references to the relevant literature.
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(310mm x 230mm x 36mm)
Springer-Verlag New York Inc.
Publisher: Springer-Verlag New York Inc.
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