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Description - Introduction to Scanning Transmission Electron Microscopy by Robert J. Keyse

Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanalysis on thin sections of material. The technique is used in many modern transmission electron microscopes and an increasing number of special

Buy Introduction to Scanning Transmission Electron Microscopy by Robert J. Keyse from Australia's Online Independent Bookstore, Boomerang Books.

Book Details

ISBN: 9781859960660
ISBN-10: 1859960669
Format: Paperback
(234mm x 156mm x 6mm)
Pages: 128
Imprint: Bios Scientific Publishers Ltd
Publisher: Taylor & Francis Ltd
Publish Date: 15-Jun-1997
Country of Publication: United Kingdom

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