We are open! For operations and delivery updates due to COVID-19. (click here)
0

Call Boomerang Books 1300 36 33 32

Description - Electron Beam-Specimen Interactions and Simulation Methods in Microscopy by Budhika G. Mendis

A detailed presentation of the physics of electron beam-specimen interactions
Electron microscopy is one of the most widely used characterisation techniques in materials science, physics, chemistry, and the life sciences. This book examines the interactions between the electron beam and the specimen, the fundamental starting point for all electron microscopy. Detailed explanations are provided to help reinforce understanding, and new topics at the forefront of current research are presented. It provides readers with a deeper knowledge of the subject, particularly if they intend to simulate electron beam-specimen interactions as part of their research projects. The book covers the vast majority of commonly used electron microscopy techniques. Some of the more advanced topics (annular bright field and dopant atom imaging, atomic resolution chemical analysis, band gap measurements) provide additional value, especially for readers who have access to advanced instrumentation, such as aberration-corrected and monochromated microscopes.
Electron Beam-Specimen Interactions and Simulation Methods in Microscopy offers enlightening coverage of: the Monte-Carlo Method; Multislice Simulations; Bloch Waves in Conventional and Analytical Transmission Electron Microscopy; Bloch Waves in Scanning Transmission Electron Microscopy; Low Energy Loss and Core Loss EELS. It also supplements each chapter with clear diagrams and provides appendices at the end of the book to assist with the pre-requisites.

A detailed presentation of the physics of electron beam-specimen interactions

Each chapter first discusses the background physics before moving onto simulation methods

Uses computer programs to simulate electron beam-specimen interactions (presented in the form of case studies)

Includes hot topics brought to light due to advances in instrumentation (particularly aberration-corrected and monochromated microscopes)

Electron Beam-Specimen Interactions and Simulation Methods in Microscopy benefits students undertaking higher education degrees, practicing electron microscopists who wish to learn more about their subject, and researchers who wish to obtain a deeper understanding of the subject matter for their own work.

Buy Electron Beam-Specimen Interactions and Simulation Methods in Microscopy by Budhika G. Mendis from Australia's Online Independent Bookstore, Boomerang Books.

Book Details

ISBN: 9781118456095
ISBN-10: 1118456092
Format: Hardback
(238mm x 160mm x 18mm)
Pages: 296
Imprint: John Wiley & Sons Inc
Publisher: John Wiley & Sons Inc
Publish Date: 27-Apr-2018
Country of Publication: United States

Book Reviews - Electron Beam-Specimen Interactions and Simulation Methods in Microscopy by Budhika G. Mendis

» Have you read this book? We'd like to know what you think about it - write a review about Electron Beam-Specimen Interactions and Simulation Methods in Microscopy book by Budhika G. Mendis and you'll earn 50c in Boomerang Bucks loyalty dollars (you must be a Boomerang Books Account Holder - it's free to sign up and there are great benefits!)


Author Biography - Budhika G. Mendis

BUDHIKA G. MENDIS, PhD, is Associate Professor at the Department of Physics, Durham University, UK, where he teaches electron microscopy at both undergraduate and postgraduate levels. He has over 15 years of experience in all the major electron microscopy techniques, including aberration-correction, and has used many of the simulation methods discussed in this book as part of his own research.

A Preview for this title is currently not available.