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Book DetailsISBN: 9780199796212
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Gordon Roberts is James McGill Professor in the Department of Electrical and Computer Engineering at McGill University. He has conducted extensive research on analog integrated circuit design and mixed-signal test issues. Dr. Roberts has published numerous papers at IEEE conferences, coauthored several textbooks related to mixed-signal test and analog integrated circuit design (including SPICE, Second Edition, with Adel Sedra, OUP, 1996), and contributed various specialized volumes to other books. Friedrich Taenzler is an RF-Engineering Manager at Texas Instruments and a major contributor in the field of RF testing and design. Mark Burns is a former TI fellow at Texas Instruments and an accomplished expert in mixed-signal IC test and measurement area.
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