Description - Random, Non-Random and Periodic Faulting in Crystals by
This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide.
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(230mm x 156mm x mm)
Gordon & Breach Science Publishers Ltd
Publisher: Gordon and Breach
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