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Description - Recent Advances in Topography Research by Jan Buytaert

The book at hand covers many of the different classes of topography/profilometry, and will give the reader an overview of different aspects of current profilometric methods. The intent is to show the possibilities, the state-of-the-art and some recent advances in the field by bringing together a non-exhaustive but diverse selection of profilometric methods. Some methods are fresh and unique like the one pixel profilometer or the sampling moire method. Others are more consolidated, like Fourier transform profilometry but now in real-time, and even commercially available, like the newest time-of-flight cameras for 3D vision. The techniques in this book range from projection moire to binary dithering pattern projection to areal surface mapping. They include an endoscopic implementation to an omnidirectional vision system and techniques using Fourier analysis to time-of-flight principles. Also, techniques applicable in biomedicine to engineering applications. Even from atomic force microscopy to optical coherence tomography, which both used as topographical means. Finally, some in-depth specialist reviews are included of new profilometric methods or new commercial profilometric devices. The book contains 12 chapters from selected authors from all over the world considered authorities in their field. The individual chapters are written to give a thorough introduction to each respective topographic method, and include a lot of background and abundant references, so that the book serves as a good introduction or reference.

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Book Details

ISBN: 9781626188402
ISBN-10: 1626188408
Format: Hardback
(260mm x 180mm x mm)
Pages: 384
Imprint: Nova Science Publishers Inc
Publisher: Nova Science Publishers Inc
Publish Date: 1-Jul-2013
Country of Publication: United States

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