Description - Semiconductor Device and Failure Analysis by Wai-Kin Chim
The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission Microscopy (PEM) is a physical fault localisation technique used for analysing IC failures. Detailing the PEM technique and its application to semiconductor device analysis, this unique reference:
* Illustrates the application of the PEM technique in various areas of device reliability, in particular hot-carrier, oxide and ESD reliability.
* Presents the principles of design and calibration for a spectroscopic emission microscope system along with coverage of the three main operation modes: frontside, backside and spectroscopic PEM
* Provides an analysis of light emission in semiconductors under hot-carrier and high-field impulse stressing in MOS transistors and photon emission from biased MOS capacitors.
Not only an essential reference for researchers and students in the field, the numerous practical examples throughout the text also make this an indispensible guide for failure analysis engineers and microelectrics industry professionals.
Buy Semiconductor Device and Failure Analysis by Wai-Kin Chim from Australia's Online Independent Bookstore, Boomerang Books.
(261mm x 186mm x 21mm)
John Wiley & Sons Ltd
Publisher: John Wiley and Sons Ltd
Country of Publication:
Book Reviews - Semiconductor Device and Failure Analysis by Wai-Kin Chim
» Have you read this book? We'd like to know what you think about it - write a review about Semiconductor Device and Failure Analysis book by Wai-Kin Chim and you'll earn 50c in Boomerang Bucks loyalty dollars (you must be a Boomerang Books Account Holder - it's free to sign up and there are great benefits!)