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Thin Films and Coatings: Toughening and Toughness Characterization captures the latest developments in the toughening of hard coatings and in the measurement of the toughness of thin films and coatings. Featuring chapters contributed by experts from Australia, China, Czech Republic, Poland, Singapore, Spain, and the United Kingdom, this book:
Toughening and toughness measurement (of films and coatings) are two related, yet separate, fields of great importance in today's nanotechnology world. Thin Films and Coatings: Toughening and Toughness Characterization is a timely reference written in such a way that novices will find it a stepping stone to the field and veterans will find it a rich source of information for their research.
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Book DetailsISBN: 9781482222906
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Sam Zhang holds a Ph.D in ceramics from the University of Wisconsin-Madison, USA, and is a tenured full professor in the School of Mechanical and Aerospace Engineering at Nanyang Technological University, Singapore. Professor Zhang was conferred the title of Honorary Professor of the Institute of Solid State Physics, Chinese Academy of Sciences, Anhui. He also holds guest professorships at Zhejiang University, Hangzhou, China and Harbin Institute of Technology, China. Professor Zhang is the founding editor-in-chief of Nanoscience and Nanotechnology Letters and principal editor of Journal of Materials Research. He has authored/coauthored 11 books, more than 20 book chapters, and 290+ peer-reviewed international journal articles. In addition, he has guest-edited more than 10 journal volumes. As of April 30, 2015, Professor Zhang's articles have been cited more than 4952 times and his h-index is 39. A popular invited lecturer, he is the founder and chair of the biennial International Conference on Technological Advances of Thin Films & Surface Coatings conference series, the founding president of the Thin Films Society, and was a fellow of the Institute of Materials, Minerals and Mining, UK. He was featured in the first ever Who's Who in Engineering Singapore, and in the 26th and 27th editions of Who's Who in the World.
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